61. ISTFA 2002 :
پدیدآورنده :
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
62. ISTFA 2004
پدیدآورنده :
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
رده :
TK7871
.
I48
2004
63. ISTFA 2009 :
پدیدآورنده : sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
64. ISTFA 2010
پدیدآورنده : sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electronic apparatus and appliances-- Testing, Congresses.,Electronics-- Materials-- Testing, Congresses.
رده :
TK7871
.
I87
2010eb
65. ISTFA 2008 :
پدیدآورنده : sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electronic apparatus and appliances-- Testing, Congresses,Electronics-- Materials-- Testing, Congresses
66. Introduction to component testing :application electronics
پدیدآورنده : Stevens, Anthony K.
کتابخانه: Central Library and Information Center of Birjand University (South Khorasan)
موضوع : Testing ، Electronic apparatus and appliances
رده :
TK
7870
.
S85
1986
67. Know your signal generators
پدیدآورنده : Middleton, Robert Gordon
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : Testing ، Electronic apparatus and appliances,، Electronic measurements
رده :
TK
7870
.
M459
1965
68. Lock-in thermograph
پدیدآورنده : / O. Breitenstein, W. Warta, M. Langenkamp
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Electronic apparatus and appliances, Thermal properties,Electronic apparatus and appliances, Testing,Semiconductors, Thermal properties,Thermography,Electronic books
رده :
TK7870
.
25
.
B74
2010
69. Lock-in thermography
پدیدآورنده : O. Breitenstein, W. Warta, M. Langenkamp
کتابخانه: Central Library and Information Center of Shahed University (Tehran)
موضوع : Electronic apparatus and appliances, Thermal properties,Electronic apparatus and appliances, Testing,Semiconductors, Thermal properties,Thermography
رده :
TK
،
7870
.
25
،.
B74
،
2010
70. Lock-in thermography
پدیدآورنده : O. Breitenstein, W. Warta, M. Langenkamp.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electronic apparatus and appliances-- Testing.,Electronic apparatus and appliances-- Thermal properties.,Semiconductors-- Thermal properties.,Thermography.
رده :
TK7870
.
25
.
B74
2010eb
71. Lock-in thermography
پدیدآورنده : O. Breitenstein, W. Warta, M. Langenkamp.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electronic apparatus and appliances-- Testing.,Electronic apparatus and appliances-- Thermal properties.,Semiconductors-- Thermal properties.,Thermography.
رده :
TK7870
.
25
.
B74
2010eb
72. Lock-in thermography
پدیدآورنده : / O. Breitenstein, W. Warta, M. Langenkamp
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Electronic apparatus and appliances, Thermal properties,Electronic apparatus and appliances, Testing,Semiconductors, Thermal properties,Thermography
رده :
E-BOOK
73. Manual of electronic servicing tests and measurements
پدیدآورنده : Robert C. Genn, Jr
موضوع : Electronic apparatus and appliances--Testing,Electronic apparatus and appliances--Maintenance and repair,Electronic measurements
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
74. Manual of electronic servicing tests and measurements
پدیدآورنده : Genn, Robert C.
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Testing ، Electronic apparatus and appliances,Maintenance and repair ، Electronic apparatus and appliances,، Electronic measurements
رده :
TK
7870
.
G4218
1990
75. McGraw-Hill electronic testing handbook. procedures and techniques /
پدیدآورنده : Lenk, John D., John D. Lenk
موضوع : ، Electronic instruments- Handbooks, manuals, etc,، Electronic apparatus and appliances- Testing- Handbooks, manuals, etc
۵ نسخه از این کتاب در ۵ کتابخانه موجود است.
76. McGraw-Hill electronic testing handbook : procedures and techniques
پدیدآورنده : Lenk, John D.
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Electronic instruments - Handbooks, manuals, etc , Electronic apparatus and appliances - Testing - Handbooks, manuals, etc
رده :
TK
7878
.
4
.
L4514
1994
77. McGraw- Hill electronic testing handbook procedures and techniques
پدیدآورنده : Lenk, John D.
کتابخانه: (Semnan)
موضوع : ، Electronic instruments- Handbooks, Manuals, etc,، Electronic apparatus and appliances- Testing-- Handbooks, manuals,etc
رده :
TK
7878
.
4
.
L4M2
78. McGraw-Hill electronic testing handbook: procedures and techniques
پدیدآورنده : Lenk, John D.
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Electronic instruments- Handbooks, manuals, etc,، Electronic apparatus and appliances- Testing- Handbooks, manuals, etc
رده :
TK
7878
.
4
.
L4514
79. Microelectronic failure analysis :
پدیدآورنده : prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Electronic apparatus and appliances-- Testing, Handbooks, manuals, etc,Electronics-- Materials-- Testing, Handbooks, manuals, etc,Microelectronics-- Materials-- Defects, Handbooks, manuals, etc,Microelectronics-- Materials-- Testing, Handbooks, manuals, etc,Semiconductors-- Defects, Handbooks, manuals, etc
80. Microelectronic failure analysis: Instrumentation, science, materials and applications
پدیدآورنده : prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee
کتابخانه: Library of Institute For Color Science and Technology (Tehran)
موضوع : Electronics--Materials--Testing--Handbooks, manuals, etc,Microelectronics--Materials--Testing--Handbooks, manuals, etc,Microelectronics--Materials--Defects--Handbooks, manuals, etc,Electronic apparatus and appliances--Testing--Handbooks, manuals, etc,Semiconductors--Defects--Handbooks, manuals, etc
رده :
{
1648
},
fe823984b80082dc2d17ebe2cd118be2
